Electronics of Time-of-flight Measurement for Back-n at CSNS
T. Yu,P. Cao,X. Y. Ji,L. K. Xie,X. R. Huang,Q. An,H. Y. Bai,J. Bao, Y. H. Chen,P. J. Cheng,Z. Q. Cui,R. R. Fan,C. Q. Feng,M. H. Gu,Z. J. Han,G. Z. He,Y. C. He, Y. F. He,H. X. Huang,W. L. Huang,X. L. Ji,H. Y. Jiang,W. Jiang,H. T. Jing,L. Kang,B. Li,L. Li,Q. Li, X. Li, Y. Li,R. Liu,S. B. Liu,X. Y. Liu,G. Y. Luan,Y. L. Ma, C. J. Ning,J. Ren,X. C. Ruan,Z. H. Song, H. Sun, X. Y. Sun,Z. J. Sun,Z. X. Tan,J. Y. Tang,H. Q. Tang,P. C. Wang, Q. Wang,T. F. Wang, Y. F. Wang,Z. H. Wang,Z. Wang,J. Wen,Z. W. Wen,Q. B. Wu, X. G. Wu,X. Wu,Y. W. Yang,H. Yi,L. Yu,Y. J. Yu,G. H. Zhang,L. Y. Zhang,J. Zhang,Q. M. Zhang, Q. W. Zhang, X. P. Zhang,Y. T. Zhao,Q. P. Zhong, L. Zhou,Z. Y. Zhou,K. J. Zhu IEEE Transactions on Nuclear Science（2019）
Key words
Nuclear electronics,time stamp,time-of-flight (TOF) measurement
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