Circuit Level Esd Simulation With Spice: Successes And Challenges

Yuanzhong Paul Zhou,Jean-Jacques Hajjar,Srivats Parthasarathy

2018 14TH IEEE INTERNATIONAL CONFERENCE ON SOLID-STATE AND INTEGRATED CIRCUIT TECHNOLOGY (ICSICT)（2018）

引用 0|浏览4

暂无评分

摘要

The present state of compact device modelling for circuit level ESD simulation with SPICE has been reviewed. An industry perspective on the key factors that are important for successful ESD event simulation is provided. The main challenges for the future ESD model developments are also discussed,

查看译文

关键词

circuit level ESD simulation,SPICE,successful ESD event simulation,ESD model developments

AI 理解论文

溯源树

样例

生成溯源树，研究论文发展脉络

Chat Paper

正在生成论文摘要