Multiscale Modeling of Total Ionizing Dose Effects in Commercial-off-the-Shelf Parts in Bipolar Technologies

IEEE Transactions on Nuclear Science(2019)

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摘要
A multiscale modeling platform that supports the “virtual” qualification of commercial-off-the-shelf parts is presented. The multiscale approach is divided into two modules. The first module generates information related to the bipolar junction transistor gain degradation that is a function of fabrication process, operational, and environmental inputs. The second uses this information as inputs fo...
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关键词
Integrated circuit modeling,Hydrogen,Databases,Transistors,Semiconductor process modeling,Degradation,Computational modeling
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