Spin resolved Imaging with Scanning Field-Emission Microscopy

Secondary electrons emitted from a scanning field-emission microscope are spin analyzed with a Mott detector. Spin polarization up to 15% is observed with a lateral resolution of less than 5 nm, with a potential resolution of even less than 1 nm. In this paper the proof of principle is conducted by comparing this method with a well-established method of spin mapping and with reference samples examined by these two microscopes.