Temperature-Switching During Irradiation as a Test for ELDRS in Linear Bipolar Devices

A temperature-switching irradiation (TSI) sequence has been developed that is based on a first-principles understanding of interface-trap buildup and annealing. The dynamics of interface-trap buildup and annealing during elevated temperature irradiation are described in detail to provide background, context, and enhanced understanding of the TSI method. The method is shown to be a practical and co...