CDM stress rise time: impact on Forward Recovery Effect for HV ESD protections
2018 40th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)（2018）
摘要
Maximum current value, strictly related to the IC package, is used for suitable CDM ESD protections sizing at required CDM voltage level, but Recovery Effects on HV ESD protections depend on current rise time, another package-dependent parameter in CDM. The impact of current rise time in CDM test is investigated.
更多查看译文
关键词
forward recovery effect,HV ESD protections,maximum current value,IC package,suitable CDM ESD protections,required CDM voltage level,Recovery Effects,current rise time,package-dependent parameter,CDM stress rise time
AI 理解论文
溯源树
样例
生成溯源树，研究论文发展脉络
Chat Paper
正在生成论文摘要