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Measurement and Evaluation of the Defects in Cd1−xZnxTe Materials by Observing Their Etch Pits in Real Time

H. X. Yu,J. R. Yang,J. J. Zhang,C. Xu,S. W. Sun, C. H. Zhou

JOURNAL OF CRYSTAL GROWTH（2019）

引用 6|浏览28
关键词
Defects,Etching,Line defects,Volume defects,Semiconducting II-VI materials
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