DAMSEL—Dynamic and Applicative Measurement of Single Events in Logic

Maximilien Glorieux,Adrian Evans,Dan Alexandrescu,Cesar Boatella-Polo, Kevin Sanchez,Veronique Ferlet-Cavrois

IEEE Transactions on Nuclear Science（2018）

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摘要

This paper describes a circuit called dynamic and applicative measurement of single events in logic (DAMSEL), which can individually measure the impact of single event upsets and single-event transients (SETs) in realistic, synchronous digital circuits. Heavy-ion and pulsed laser test results are presented. Both a simple digital and an analog simulation methodology are demonstrated to provide simi...

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关键词

Logic gates,Integrated circuit modeling,SPICE,Adders,Measurement by laser beam,Transient analysis,Data models

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