Memory effect by charging of ultra‐small 2‐nm laser‐synthesized solution processable Si‐nanoparticles embedded in Si–Al2O3–SiO2 structure [Phys. Status Solidi A 212, 1751–1755 (2015)]
PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE（2016）
关键词
atomic layer deposition,charge trapping memory,laser processing,metal-oxide-semiconductor structures,nanoparticles,silicon
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