Advances in Large-Scale Metrology – Review and future trends

R.H. Schmitt,M. Peterek,E. Morse,W. Knapp,M. Galetto, F. Härtig, G. Goch, B. Hughes, A. Forbes, W.T. Estler

CIRP Annals(2016)

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摘要
The field of Large-Scale Metrology has been studied extensively for many decades and represents the combination and competition of topics as diverse as geodesy and laboratory calibration. A primary reason that Large-Scale Metrology continues to represent the research frontier is that technological advances introduced and perfected at a conventional scale face additional challenges which increase non-linearly with size. This necessitates new ways of considering the entire measuring process, resulting in the application of concepts such as virtual measuring processes and cyber-physical systems. This paper reports on the continuing evolution of Large-Scale Metrology.
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关键词
Metrology,Modeling,Large-Scale Metrology
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