Patterning of graphene on silicon-on-insulator waveguides through laser ablation and plasma etching

Proceedings of SPIE(2016)

引用 0|浏览12
暂无评分
摘要
We present the use of ferntosecond laser ablation for the removal of monolayer grapheme from silicon-on-insulator (SOI) waveguides, and the use of oxygen plasma etching through a metal mask to peel off graphene from the grating couplers attached to the waveguides. Through Raman spectroscopy and atomic force microscopy, we show that the removal of graphene is successful with minimal damage to the underlying SOI waveguides. Finally, we employ both removal techniques to measure the contribution of graphene to the loss of grating-coupled graphene-covered SOI waveguides using the cut-back method. This loss contribution is measured to he 0.132 dB/mu m.
更多
查看译文
关键词
graphene,laser ablation,loss measurement,plasma etching,Raman spectroscopy,silicon photonics,waveguides
AI 理解论文
溯源树
样例
生成溯源树,研究论文发展脉络
Chat Paper
正在生成论文摘要