Dynamic SEE Testing of Selected Architectural Features of Xilinx 28 Nm Virtex-7 FPGAs

Gary M. Swift,Stephen E. Stone, Sebastian E. Garcia, Kevin W. Wray, William J. Rowe, Krysten H. Pfau, Robert Liu, Jonathan Holden, Asa Angeles, Barry L. Willits, Kyle P. Robinson,Andres Perez-Celis,Michael J. Wirthlin

2017 17TH EUROPEAN CONFERENCE ON RADIATION AND ITS EFFECTS ON COMPONENTS AND SYSTEMS (RADECS)（2017）

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关键词

SEE,FPGA,IOB,SERDES,PLL,MMCM,BRAM,EDAC,beam testing,soft-error rate,space,avionics

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