SyRA: Early System Reliability Analysis for Cross-Layer Soft Errors Resilience in Memory Arrays of Microprocessor Systems.
IEEE Transactions on Computers(2019)
摘要
Cross-layer reliability is becoming the preferred solution when reliability is a concern in the design of a microprocessor-based system. Nevertheless, deciding how to distribute the error management across the different layers of the system is a very complex task that requires the support of dedicated frameworks for cross-layer reliability analysis. This paper proposes SyRA, a system-level cross-l...
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关键词
Bayes methods,Software reliability,Hardware,Microprocessors,Resilience,Complexity theory
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