Electromigration-Aware Interconnect Design

ISPD, pp. 83-90, 2019.

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EI

Abstract:

Electromigration (EM) is seen as a growing problem in recent and upcoming technology nodes, and affects a wider variety of wires (e.g., power grid, clock/signal nets), circuits (e.g., digital, analog, mixed-signal), and systems (e.g., mobile, server, automotive), touching lower levels of metal than before. Moreover, unlike traditional EM ...More

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