DeepCT: Tomographic Combinatorial Testing for Deep Learning Systems
2019 IEEE 26th International Conference on Software Analysis, Evolution and Reengineering (SANER), pp. 614-618, 2019.
Deep learning (DL) has achieved remarkable progress over the past decade and has been widely applied to many industry domains. However, the robustness of DL systems recently becomes great concerns, where minor perturbation on the input might cause the DL malfunction. These robustness issues could potentially result in severe consequences ...More
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