Experimental Evaluation of Electron Scattering Mechanisms in SiC MOS Inversion LayerMunetaka Noguchi,Toshiaki Iwamatsu,Hiroyuki Amishiro,Hiroshi Watanabe,Koji Kita,Satoshi YamakawaThe Japan Society of Applied Physics(2018)引用 23|浏览11暂无评分AI 理解论文溯源树样例生成溯源树,研究论文发展脉络Chat Paper正在生成论文摘要