First On-Beam Tests of the Farcos Frontend Electronics
2017 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC)（2017）
Key words
on-beam tests,FARCOS frontend electronics,Femtoscope ARray,novel modular detection system,high angular energy resolution,correlation measurements,Light Charged Particles,LCPs,Intermediate Mass Fragments,Si layer,stringent requirements,dynamic range,integral-nonlinearity,VLSI frontend,readout signals,scintillation light,FARCOS telescope,designed VLSI,test beam,designed frontend electronics,detection stages,for Correlation and Spectroscopy,Si,Au,LiF,Ni
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