Calibrating nadir striped artifacts in a multibeam backscatter image using the equal mean-variance fitting model

Acoustic seafloor classification with multibeam backscatter measurements is an attractive approach for mapping seafloor properties over a large area. However, artifacts in the multibeam backscatter measurements prevent accurate characterization of the seafloor. In particular, the backscatter level is extremely strong and highly variable in the near-nadir region due to the specular echo phenomenon. Consequently, striped artifacts emerge in the backscatter image, which can degrade the classification accuracy. This study focuses on the striped artifacts in multibeam backscatter images. To this end, a calibration algorithm based on equal mean-variance fitting is developed. By fitting the local shape of the angular response curve, the striped artifacts are compressed and moved according to the relations between the mean and variance in the near-nadir and off-nadir region. The algorithm utilized the measured data of near-nadir region and retained the basic shape of the response curve. The experimental results verify the high performance of the proposed method. (C) 2017 Society of Photo-Optical Instrumentation Engineers (SPIE)