Wideband Microwave Reflectometry for Rapid Detection of Dissimilar and Aged ICs.

Satyajeet Shinde,Sasi Jothibasu,Mohammad Tayeb Ahmad Ghasr,Reza Zoughi

IEEE Transactions on Instrumentation and Measurement（2017）

引用 19|浏览5

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摘要

A wideband microwave method is described as a means for rapid detection of slight dissimilarities and aging effects in integrated circuits (ICs). The method is based on measuring the complex reflection coefficient of an IC when illuminated with an open-ended rectangular waveguide probe, at K-band (18-26.5 GHz) and Ka-band (26.5-40 GHz) microwave frequencies. The spatially integrated reflected elec...

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关键词

Frequency measurement,Apertures,Aging,Wideband,Microwave measurement,Microwave FET integrated circuits

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