Approximate Error Detection With Stochastic Checkers.

IEEE Transactions on Very Large Scale Integration (VLSI) Systems(2017)

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摘要
Designing reliable systems, while eschewing the high overheads of conventional fault tolerance techniques, is a critical challenge in the deeply scaled CMOS and post-CMOS era. To address this challenge, we leverage the intrinsic resilience of application domains such as multimedia, recognition, mining, search, and analytics where acceptable outputs are produced despite occasional approximate compu...
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关键词
Circuit faults,Stochastic processes,Fault tolerance,Fault tolerant systems,Clocks,Timing,Histograms
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