Can Dark Silicon Be Exploited to Prolong System Lifetime?

IEEE Design & Test(2017)

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摘要
Besides stringent power and thermal constraints, a dark silicon chip is also subjected to various reliability threats. This article illustrates how the dark silicon can be exploited to improve the chip's lifetime through efficient utilization of computational resources and power budget, while still performing in a similar way. -Muhammad Shafique, Vienna University of Technology.
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关键词
Reliability,Silicon,Runtime,Density measurement,Resource management,Temperature measurement,Temperature sensors
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