Deep trench capacitor in three dimensional through silicon via keepout area for electrostatic discharge protection

IEEE Transactions on Semiconductor Manufacturing(2016)

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摘要
To fully enable and leverage the power of advanced processors, products must have abundant cache memory with much shorter access paths without increasing chip size. This requires growing products in the z-direction by building stacked chips (3-D chips). To optimize 3-D product costs, the area consumed by other processing requirements such as electrostatic discharge (ESD) protection needs to be as ...
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关键词
Electrostatic discharges,Three-dimensional integrated circuits,Through-silicon vias,Capacitors
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