Radiation Hardening by Process of CBRAM Resistance Switching Cells

IEEE Transactions on Nuclear Science(2016)

引用 16|浏览32
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摘要
Non-volatile memory (NVM) technology highly resistant to ionizing dose and radiation effects in general continues to be a challenge for space missions. Novel NVM nano-ionic technologies known as conductive bridging random access memory (CBRAM), a resistive circuit technology, exhibits great promise for both high density memory and high total ionizing dose resilience. In this work, it is discovered...
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关键词
capacitor switching,ionisation chambers,radiation hardening (electronics),random processes
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