XRF topography information: Simulations and data from a novel silicon drift detector system

Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment（2019）

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摘要

This work presents the latest findings of an ongoing research project Billé et al. [1] where the angular dependence of XRF detection could be exploited for the topographical study of the specimen. It presents the results of a simulation framework and of measurements performed with a new detector system [2] deployed on the TwinMic beamline [3] (Elettra Sincrotrone Trieste, Trieste, Italy).

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关键词

X-ray fluorescence,Topography,XRF artefacts,XRF angular dependence,XRF map correction

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