Impact of the post-thermal annealing on OFETs using printed contacts, printed organic gate insulator and evaporated C60 active layer

Zhi Tao,Tayeb Mohammed-Brahim,Wei Lei,Maxime Harnois,Emmanuel Jacques

Solid-State Electronics（2018）

引用 7|浏览9

暂无评分

摘要

•Investigation of thermal annealing process influence on printed n-type OFET.•Investigation of organic semiconductor layer thickness impacts on C60 OFET.•Investigation on relationships between OFET stability and C60 crystalline structure.•Investigation on Pseudo-CMOS inverter logic circuits.

查看译文

关键词

Inkjet printing drop-on-demand,Organic FET,Physical characterization,Electrical characterization,Post-thermal annealing,Time answer

AI 理解论文

溯源树

样例

生成溯源树，研究论文发展脉络

Chat Paper

正在生成论文摘要