DVFS Binning Using Machine-Learning Techniques

Keng-Wei Chang
Keng-Wei Chang
Chun-Yang Huang
Chun-Yang Huang
Jian-Min Huang
Jian-Min Huang

international test conference, pp. 31-36, 2018.

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Abstract:

This paper presents a framework which can avoid the lengthy system test by utilizing machine-learning techniques to classify parts into different DVFS bins based on the results collected at CP and FT test only. The core machine-learning techniques in use are Bayesian linear regression for model fitting and stepwise regression for feature ...More

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