Silicon Drift Detectors in Electron Microscopy - An Over 20 Year History with a Bright FutureA. Liebel, A. Schöning,A. Bechteler,K. Hermenau,K. Heinzinger,L. Strüder,A. Niculae,Heike SoltauMicroscopy and Microanalysis(2018)引用 1|浏览25暂无评分AI 理解论文溯源树样例生成溯源树,研究论文发展脉络Chat Paper正在生成论文摘要