Hard X-ray Resonant Ptychography for Chemical Imaging at the Sensitivity LimitJuliane Reinhardt,Andreas Schropp,Mikhail Lyubomirskiy,Martin Seyrich,Dennis Bruckner,Thomas F. Keller,Vedran Vonk, Sergey Volko,A. Stierle,Edvinas Navickas,Jürgen Fleig,Christian G. SchroerMicroscopy and Microanalysis(2018)引用 2|浏览9暂无评分AI 理解论文溯源树样例生成溯源树,研究论文发展脉络Chat Paper正在生成论文摘要