Influence of compositional variation on the optical and morphological properties of GeSbSe films for optoelectronics application

Infrared Physics & Technology（2018）

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摘要

Imaginary part of the dielectric function of the GexSb40-xSe60 films in the middle-IR range (dielectric loss function Im(−1/ε) in the inset).

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关键词

GexSb40-xSe60 films,Spectroscopic ellipsometry,Optical constants,FT Raman spectroscopy,Surface morphology

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