Method for evaluating interfacial resistances of thermoelectric devices using I-V measurement

Dong Hwan Kim,Cham Kim,Jong Tae Kim,Duck Ki Yoon,Hoyoung Kim

Measurement（2018）

引用 8|浏览14

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摘要

•An evaluation method of the interfacial resistance of a TEG device is proposed.•Analytic expressions for the VOC and ISC have been derived.•The electrical contact resistance of a thermoelectric device calculated.•The evaluation method can be used as an index to improve the soldering process.

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关键词

Electrical contact resistance,Interfacial thermal resistance,Thermoelectric device,Power generation,Open circuit voltage,Short circuit current

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