RF Performance of a Highly Linear Power Amplifier EDNMOS Transistor on Trap-Rich SOI

IEEE Electron Device Letters(2018)

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摘要
Results specific to power amplifiers (PAs) designed using a SOI EDNMOS transistor free of kinks in ID-VD plane and high breakdown voltage are presented. The suppression of the drain current kink and improvement in breakdown voltage are achieved by the omission of the N+ source implant step. Instead, the source junction is realized by an optimized NLDD implant step only, allowing the formation of a...
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关键词
Transistors,Radio frequency,Performance evaluation,Junctions,Implants,Logic gates,Power amplifiers
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