Combinatorial temperature resistance sensors for the analysis of phase transformations demonstrated for metallic glasses

We describe a sensor for measuring the electrical resistance of a conducting thin-film material as a function of temperature and composition. The sensor has excellent sensitivity and can be used at temperatures as high as the melting temperature of the material of interest. The sensor is fabricated by applying a simple lift-off process to a thin film. By combining combinatorial sputtering to fabricate composition spreads with arrays of sensors, the phase transformation behavior of complex alloys can be mapped. We demonstrate this capabilities by using the sensor to determine the glass transition and crystallization temperatures of several PdSiCu-based metallic glasses. We found that in two glass-forming systems, PdCuSi and NiZr, the ratio of the resistance of the crystallized to as-deposited material is correlated with the glass-forming ability. The ability to readily determine glass forming ability, suggests that the sensor is a powerful tool for measuring the glass-forming ability in a high-throughput manner over large compositional spaces.