On The Evaluation Of Electromagnetic Information Leakage From Mobile Device Screens

2018 JOINT IEEE INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY AND 2018 IEEE ASIA-PACIFIC SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY (EMC/APEMC)(2018)

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摘要
We present a statistical testing based methodology for evaluating electromagnetic radiation from a tested mobile device that potentially contains exploitable information for reconstructing screen images of the device. The basic idea is to employ a statistical test instead of reconstructing screen images. The validity of our methodology is demonstrated in a real-world setting by an experiment observing EM radiation from a tablet device's screen that would be usable in a TEMPEST attack.
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关键词
statistical test, TEMPEST, side-channel analysis, information leakage
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