Study on the Method to Measure the Thermal Contact Resistance within Press pack IGBTs

Erping Deng,Zhibin Zhao,Peng Zhang, Xiaochuang Luo,Jinyuan Li,Yongzhang Huang

IEEE Transactions on Power Electronics（2019）

引用 35|浏览22

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摘要

The accurate measurement of the thermal contact resistance between multilayers within press pack insulated gate bipolar transistors (PP IGBTs) is significant for optimizing their thermal resistance to improve reliability, as thermal contact resistance accounts for about 50% of their total thermal resistance under the rated clamping force. The components within PP IGBTs are very small, and an exter...

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关键词

Thermal resistance,Insulated gate bipolar transistors,Contact resistance,Temperature measurement,Electrical resistance measurement,Semiconductor device measurement,Thermal force

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