6H-SiC-Fe Nanostructures Studied by Atom Probe Tomography

IEEE Magnetics Letters(2018)

引用 5|浏览19
暂无评分
摘要
Low-dose (2 at.%) Fe implantation in 6H-SiC (0001), followed by high-temperature annealing, is investigated with the aim of obtaining a diluted magnetic semiconductor (DMS). The effects of rapid thermal annealing on the microstructure were examined by atom probe tomography. The study shows the evidence of the formation of nanoclusters after annealing, some of which are magnetic. The structural stu...
更多
查看译文
关键词
Iron,Silicon carbide,Annealing,Silicon,Chemicals,Nanoparticles,Probes
AI 理解论文
溯源树
样例
生成溯源树,研究论文发展脉络
Chat Paper
正在生成论文摘要