Infrared Metrology Using Visible Photons

Anna Paterova,Hongzhi Yang,Chengwu An,Dmitry A. Kalashnikov,Leonid A. Krivitsky

2018 CONFERENCE ON LASERS AND ELECTRO-OPTICS (CLEO)（2018）

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摘要

We exploit the nonlinear interference of correlated photons to demonstrate a new infrared metrology technique using detection of visible photons. The technique applies to infrared spectroscopy, optical coherence tomography, and imaging.

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关键词

visible photons,nonlinear interference,infrared metrology technique,infrared spectroscopy,optical coherence tomography

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