Multifrequency Near Field Scanning Optical Microscopy (Mf-Snom)

H. Greener,Michael Mrejen,Uri Arieli,Haim Suchowski

2018 CONFERENCE ON LASERS AND ELECTRO-OPTICS (CLEO)（2018）

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摘要

We introduce a novel excitation and detection scheme in near-field optical microscopy based on a multifrequency method. Using this method, we experimentally demonstrate enhanced sensitivity, implying improved spatial resolution in optical measurements.

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关键词

optical measurements,multifrequency near field scanning optical microscopy,spatial resolution

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