High Throughput Methods for Evaluating the Homogeneity of Nanomaterials for Nanoelectronics
2017 IEEE 12th Nanotechnology Materials and Devices Conference (NMDC)（2017）
关键词
nanoelectronics,wafer-scale homogeneous samples,single-walled carbon nanotubes,SWCNTs,identical chiral indices,graphenes,SEM imaging,true-color imaging,chirality assignment,individual carbon nanotubes,low energy transmission electron diffraction,single crystalline orientations,carbon nanotube arrays,large-area graphene,nanomaterial homogeneity,wafer-scale homogeneous sample,enhanced Rayleigh scattering
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