Modeling of Advanced RF Bulk FinFETs

IEEE Electron Device Letters(2018)

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摘要
The modeling of the advanced RF bulk FinFETs is presented in this letter. Extensive S-parameter measurements, performed on the advanced RF bulk FinFETs, show 31% improvement in cutoff frequency over recent work [1]. The transistor's characteristics are dominated by substrate parasitics at intermediate frequencies (0.1-10 GHz) and gate parasitics at high frequencies (above 10 GHz). The Berkeley sho...
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关键词
Logic gates,Radio frequency,Substrates,Capacitance,FinFETs,Resistance,Integrated circuit modeling
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