Record-high drain current in p-type 2D transistors with high-k dielectric and accumulation-type contactsAdam Charnas,Gang Qiu,Mengwei Si,Yixiu Wang,Wenzhuo Wu,Peide D. YeBulletin of the American Physical Society（2018）引用 23|浏览10暂无评分AI 理解论文溯源树样例生成溯源树，研究论文发展脉络Chat Paper正在生成论文摘要
