Analysis of Temporal Masking Effects on Master- and Slave-Type Flip-Flop SEUs and Related Applications

Rongmei Chen,N. N. Mahatme,Z. J. Diggins,Liang Wang,En Xia Zhang,Y. P. Chen,Yaqiang Liu,Balaji Narasimham,Arthur F. Witulski,B. L. Bhuva,Daniel M. Fleetwood

IEEE Transactions on Nuclear Science（2018）

引用 1|浏览38

暂无评分

摘要

Analysis of temporal masking effects of single-event upsets (SEUs) on master-slave flip-flops (FFs) is provided, considering the difference of SEU cross sections between master and slave latches. An improved model of temporal masking effects of SEUs in master-slave FFs is proposed and demonstrated through alpha-particle single-event effect (SEE) experiments. Based on the improved model, an effecti...

查看译文

关键词

Clocks,Latches,Sequential circuits,Flip-flops,Single event upsets,Integrated circuit modeling,Delays

AI 理解论文

溯源树

样例

生成溯源树，研究论文发展脉络

Chat Paper

正在生成论文摘要