Comparative Study of Cross-Point MRAM Array With Exponential and Threshold Selectors for Read Operation

IEEE Electron Device Letters(2018)

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摘要
We investigate a tunnel magnetoresistance (TMR) ratio of magnetoresistive random access memory (MRAM) devices with selectors classified as exponential and threshold types for cross-point array applications. Through array-level SPICE simulation, we analyze how the TMR ratio, which can vary with the type of the selector, affects a read-out current ratio in the array. In MRAM arrays with exponential ...
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关键词
Resistance,Tunneling magnetoresistance,Wires,Computer architecture,Switches,Degradation,Microprocessors
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