Evidence for the degradation of an emerging pollutant by a mechanism involving iso-energetic charge transfer under visible light
Applied Catalysis B: Environmental(2018)
摘要
•Cu2O is the majority Cu-oxide present in sputtered ZnO/CuOx films.•XPS provided the proof for redox reactions during the Norfloxacin abatement.•Iso-energetic Cu2O/ZnO electron transfer leads to accelerated NFXdegradation.•A mechanism is suggested for the Norfloxacin degradation on ZnO/Cu2O films.
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关键词
Sputtered ZnO/Cu2O films,Norfloxacin (NFX) degradation,IFCT,Interface potentials,Catalytic mechanism
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