A 4 + 2T SRAM for Searching and In-Memory Computing With 0.3-V $V_{\mathrm {DDmin}}$

IEEE Journal of Solid-State Circuits(2018)

引用 60|浏览49
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摘要
This paper presents a 4 + 2T SRAM for embedded searching and in-memory-computing applications. The proposed SRAM cell uses the n-well as the write wordline to perform write operations and eliminate the write access transistors, achieving 15% area saving compared with conventional 8T SRAM. The decoupled differential read paths significantly improve read noise margin, and therefore reliable multi-wo...
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关键词
SRAM cells,Transistors,Logic functions,Layout,Power demand,Reliability
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