Evaluation of contact properties for semiconducting 2H phase of MoTe 2 via scanning gate microscopyKohei Sakanashi, Kota Kamiya,Hidemitsu Ouchi, Tomoki Yamanaka,Katsuhiko Miyamoto,Takashige Omatsu,J. P. Bird,Nobuyuki AokiThe Japan Society of Applied Physics(2018)引用 23|浏览6暂无评分AI 理解论文溯源树样例生成溯源树,研究论文发展脉络Chat Paper正在生成论文摘要