Critical layer thickness of strained Si with (110) surface orientationKeisuke Arimoto,Atsushi Onogawa,Takane Yamada,Kosuke O. Hara,Junji Yamanaka,Kiyokazu NakagawaThe Japan Society of Applied Physics(2018)引用 23|浏览4暂无评分AI 理解论文溯源树样例生成溯源树,研究论文发展脉络Chat Paper正在生成论文摘要