A Model-Based-Random-Forest Framework for Predicting $V_{t}$ Mean and Variance Based on Parallel $I_{d}$ Measurement

Chien-Hsueh Lin
Chien-Hsueh Lin
Chih-Ying Tsai
Chih-Ying Tsai
Kao-Chi Lee
Kao-Chi Lee
Sung-Chu Yu
Sung-Chu Yu
Alex Hou
Alex Hou
Jih-Nung Lee
Jih-Nung Lee

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, pp. 2139-2151, 2018.

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Keywords:
Logic gatesVoltage measurementCurrent measurementPredictive modelsTime measurementMore(2+)

Abstract:

To measure the variation of device Vt requires long test for conventional wafer acceptance test (WAT) test structures. This paper presents a framework that can efficiently and effectively obtain the mean and variance of Vt for a large number of designs under test (DUTs). The proposed framework applies the model-based random forest as its ...More

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