Exploiting Parallelism and Heterogeneity in a Radiation Effects Test Vehicle for Efficient Single-Event Characterization of Nanoscale Circuits
IEEE Transactions on Nuclear Science(2018)
摘要
Novel design techniques for efficient testability are developed and have been implemented in a 14-/16-nm bulk FinFET node technology characterization vehicle. The result of this paper was the measurement of over 300 000 SETs across 12 combinational logic variants and 415 000 SEUs in three D-flip-flop designs over a large test matrix of heavy-ion linear energy transfer, angle of incidence, and supp...
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关键词
Voltage measurement,Testing,FinFETs,Logic gates,Shift registers,Flip-flops,Inverters
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