The Radon Transform On V-Lines: Artifact Analysis And Image Enhancement

2017 XVII WORKSHOP ON INFORMATION PROCESSING AND CONTROL (RPIC)(2017)

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摘要
Compton Scatter Imaging is a promising approach in imaging science. Since it employs scattered radiation that is otherwise rejected, it is claimed to improve the sensitivity of current radiation-based imaging systems. The Radon transform on V-lines models a Compton Camera and its inversion through filtered back-projection leads to an efficient way to reconstruct the density of a radiotracer. Recently, some new properties of the Radon transform on V-lines have been discovered enabling reconstruction of electronic densities in a new modality of Compton Scatter Tomography. The interest on the Radon transform on V-lines is thus renewed and novel strategies must be developed in order to fulfil the quality requirements of its applications. In this paper we study the most representative degradation effects of the Radon transform on V-lines. Particularly, we use microlocal analysis to explain its artifacts and apply some strategies to compensate them.
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关键词
Compton Scatter Imaging, V-line Radon transform, microlocal analysis, reconstruction artifacts
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