Modeling Transient Electrical Disturbances By Inductive Coupling For The Iso 7637-3 Icc Test

Niels Lambrecht,Daniël De Zutter,Dries Vande Ginste,Hugo Pues

2017 INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY - EMC EUROPE（2017）

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摘要

In this paper, we model the inductive current clamp (ICC) method described in the ISO 7637-3 standard, where we apply a broadband transient signal as disturbance. To validate the advocated model, a nonlinear device under test (DUT) is simulated, manufactured and measured under the ISO 7637-3 standard test conditions. Furthermore, it is shown that the proposed model can be used to study the DUT's immunity.

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关键词

Transient immunity, ISO 7637-3, inductive coupling clamp

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